| 发明名称 |
SCANNING ELECTROCHEMICAL MICROSCOPY |
| 摘要 |
A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging. |
| 申请公布号 |
US2015059027(A1) |
申请公布日期 |
2015.02.26 |
| 申请号 |
US201414504357 |
申请日期 |
2014.10.01 |
| 申请人 |
University of Warwick |
发明人 |
Unwin Patrick;McKelvey Kim Martin |
| 分类号 |
G01Q60/60 |
主分类号 |
G01Q60/60 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method comprising:
oscillating a scanning microscopy probe tip relative to a surface of interest; detecting damping of an amplitude of the oscillation of the probe tip resulting from the probe tip coming into contact with the surface of interest; using the detected damping to detect the surface of interest; and using the probe tip to measure or modify activity of the surface of interest simultaneously with detecting damping. |
| 地址 |
Coventry GB |
