发明名称 PHOTOELECTRIC CONVERSION DEVICE AND MANUFACTURING METHOD THEREOF
摘要 An object is to increase conversion efficiency of a photoelectric conversion device without increase in the manufacturing steps. The photoelectric conversion device includes a first semiconductor layer formed using a single crystal semiconductor having one conductivity type which is formed over a supporting substrate, a buffer layer including a single crystal region and an amorphous region, a second semiconductor layer which includes a single crystal region and an amorphous region and is provided over the butler layer, and a third semiconductor layer having a conductivity type opposite to the one conductivity type, which is provided over the second semiconductor layer. A proportion of the single crystal region is higher than that of the amorphous region on the first semiconductor layer side in the second semiconductor layer, and the proportion of the amorphous region is higher than that of the single crystal region on the third semiconductor layer side.
申请公布号 US2015053264(A1) 申请公布日期 2015.02.26
申请号 US201414514552 申请日期 2014.10.15
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 KATO Sho;HIURA Yoshikazu;SHIMOMURA Akihisa;OHTSUKI Takashi;TORIUMI Satoshi;ARAI Yasuyuki
分类号 H01L31/077;H01L31/0376 主分类号 H01L31/077
代理机构 代理人
主权项 1. A photoelectric conversion device comprising: a single crystal semiconductor layer having one conductivity type over a substrate; a buffer layer including a single crystal region and an amorphous region over the single crystal semiconductor layer; a first semiconductor layer including a single crystal region and an amorphous region over and in direct contact with the buffer layer; and a second semiconductor layer having a conductivity type opposite to the one conductivity type over the first semiconductor layer, wherein a proportion of the amorphous region in the first semiconductor layer gradually increases with respect to a proportion of the single crystal region in the first semiconductor layer as the distance from the buffer layer in the direction of the second semiconductor layer increases, and wherein the first semiconductor layer has i-type conductivity.
地址 Atsugi-shi JP