发明名称 |
METHOD FOR FORMING SELF-ALIGNED AIRGAP INTERCONNECT STRUCTURES |
摘要 |
Devices and methods for forming a self-aligned airgap interconnect structure includes etching a conductive layer to a substrate to form conductive structures with patterned gaps and filling the gaps with a sacrificial material. The sacrificial material is planarized to expose a top surface of the conductive layer. A permeable cap layer is deposited over the conductive structure and the sacrificial material, Self-aligned airgaps are formed by removing the sacrificial material through the permeable layer. |
申请公布号 |
US2015054122(A1) |
申请公布日期 |
2015.02.26 |
申请号 |
US201414505087 |
申请日期 |
2014.10.02 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Lin Qinghuang;Fletcher Benjamin L.;Cabral Cyril |
分类号 |
H01L23/532 |
主分类号 |
H01L23/532 |
代理机构 |
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代理人 |
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主权项 |
1. An integrated circuit device, comprising:
at least a pair of conductive structures configured by etching a conductive layer to form sidewalk extending through a thickness of the conductive layer; and a self-aligned airgap formed between the pair of conductive structures and being bounded by a substrate, the sidewalk of the respective conductive structures and a permeable cap layer. |
地址 |
Armonk NY US |