发明名称 METHOD FOR FORMING SELF-ALIGNED AIRGAP INTERCONNECT STRUCTURES
摘要 Devices and methods for forming a self-aligned airgap interconnect structure includes etching a conductive layer to a substrate to form conductive structures with patterned gaps and filling the gaps with a sacrificial material. The sacrificial material is planarized to expose a top surface of the conductive layer. A permeable cap layer is deposited over the conductive structure and the sacrificial material, Self-aligned airgaps are formed by removing the sacrificial material through the permeable layer.
申请公布号 US2015054122(A1) 申请公布日期 2015.02.26
申请号 US201414505087 申请日期 2014.10.02
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Lin Qinghuang;Fletcher Benjamin L.;Cabral Cyril
分类号 H01L23/532 主分类号 H01L23/532
代理机构 代理人
主权项 1. An integrated circuit device, comprising: at least a pair of conductive structures configured by etching a conductive layer to form sidewalk extending through a thickness of the conductive layer; and a self-aligned airgap formed between the pair of conductive structures and being bounded by a substrate, the sidewalk of the respective conductive structures and a permeable cap layer.
地址 Armonk NY US