发明名称 PROBE PIN AND ELECTRONIC DEVICE USING SAME
摘要 A probe pin is provided with: a coil spring (3); a first plunger (1) having a body section (11), a first elastic section (12), and a second elastic section (13), the first and second elastic sections (12, 13) extending in the same direction from the body section (11); and a second plunger (2) press fitted between the first elastic section (12) and the second elastic section (13). The first plunger (1) and the second plunger (2) are electrically conductive and are inserted into the coil spring (3) from the opposite ends (3A, 3B), respectively, thereof. The first elastic section (12) and second elastic section (13) of the first plunger (1) grip the second plunger (2) to thereby cause the first elastic section (12) to be in pressure contact with one surface of the second plunger (2). The first plunger (1) and the second plunger (2) are electrically connected through the pressure contact section.
申请公布号 WO2015025662(A1) 申请公布日期 2015.02.26
申请号 WO2014JP69237 申请日期 2014.07.18
申请人 OMRON CORPORATION 发明人 HEMMI, YOSHINOBU;SAKAI, TAKAHIRO;TERANISHI, HIROTADA
分类号 G01R1/067;H01R13/24 主分类号 G01R1/067
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