发明名称 Method of stress relief in anti-reflective coated cap wafers for wafer level packaged infrared focal plane arrays
摘要 Methods for reducing wafer bow induced by an anti-reflective coating of a cap wafer are provided. The method may utilize a shadow mask having at least one opening therein that is positioned opposite recessed regions in a cap wafer. The method may further include depositing at least one layer of an anti-reflective coating material through the shadow mask onto a planar side of a cap wafer to provide a discontinuous coating on the planar side.
申请公布号 IL236533(D0) 申请公布日期 2015.02.26
申请号 IL20140236533 申请日期 2014.12.31
申请人 RAYTHEON COMPANY 发明人
分类号 B81B 主分类号 B81B
代理机构 代理人
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