发明名称 METHOD AND APPARATUS FOR SUPPRESSING METAL-GATE CROSS-DIFFUSION IN SEMICONDUCTOR TECHNOLOGY
摘要 An inverter includes: a PMOS comprising: a p-type source region, a p-type drain region, a p-channel region between the p-type source region and the p-type drain region, and a PMOS metal gate region; a NMOS, comprising: an n-type source region, an n-type drain region, an n-channel region between the n-type source region and the n-type drain region, and a NMOS metal gate region; an insulating layer above the p-channel region and the n-channel region, wherein the PMOS metal gate region and the NMOS metal gate region are above the insulating layer; and a gate contact between the NMOS metal gate region and the PMOS metal gate region.
申请公布号 US2015054085(A1) 申请公布日期 2015.02.26
申请号 US201313973616 申请日期 2013.08.22
申请人 Xilinx, Inc. 发明人 Lin Qi;Pan Hong-Tsz;Wu Yun;Nguyen Bang-Thu
分类号 H01L27/092;H01L21/8238 主分类号 H01L27/092
代理机构 代理人
主权项 1. An inverter, comprising: a PMOS comprising: a p-type source region,a p-type drain region,a p-channel region between the p-type source region and the p-type drain region, anda PMOS metal gate region; a NMOS, comprising: an n-type source region,an n-type drain region,an n-channel region between the n-type source region and the n-type drain region, anda NMOS metal gate region; an insulating layer above the p-channel region and the n-channel region, wherein the PMOS metal gate region and the NMOS metal gate region are above the insulating layer; and a gate contact between the NMOS metal gate region and the PMOS metal gate region.
地址 San Jose CA US