发明名称 PROBE AND MANUFACTURING METHOD OF PROBE
摘要 PROBLEM TO BE SOLVED: To provide a compact probe that can be manufactured at a low cost and has a spring function.SOLUTION: There is provided a probe that is brought into contact with an electrode terminal in an electric circuit or electronic component, the probe including a first spring part, a second spring part covering the first spring part, a housing part covering the second spring part, one contact terminal part connected with the second spring part, and the other contact terminal part connected with the housing part.
申请公布号 JP2015038455(A) 申请公布日期 2015.02.26
申请号 JP20130169973 申请日期 2013.08.19
申请人 FUJITSU COMPONENT LTD 发明人 TANAKA TETSUGAKU;SATO KIMINORI;KOBAYASHI MITSURU
分类号 G01R1/067;H01L21/66 主分类号 G01R1/067
代理机构 代理人
主权项
地址