发明名称 METHOD AND DEVICE FOR DETECTING DEFECTS WITHIN A TEST OBJECT
摘要 A device and a method for detecting at least one defect in a test object (2). At least one test head (1) radiates an ultrasonic signal at different measuring points (MP) into the test object (2) with each point at an insonation or radiation angle (α) in order to ascertain multiple measurement data sets (MDS). The angle is constant for each data set (MDS). An analyzing unit (4) carries out an SAFT (Synthetic Aperture Focusing Technique) analysis for each ascertained measurement data set (MDS) using a common reconstruction grid (RG) inside the test object (2) in order to calculate an SAFT analysis result for each measurement data set (MDS). The analyzing unit (4) superimposes the calculated SAFT analysis results in order to calculate an orientation-independent defect display value (SRP) for each reconstruction point (RP) of the common reconstruction grid (RG).
申请公布号 US2015057953(A1) 申请公布日期 2015.02.26
申请号 US201214370651 申请日期 2012.12.28
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 Heinrich Werner;Mooshofer Hubert
分类号 G01N29/44;G01N29/22;G01N29/32;G01N29/04 主分类号 G01N29/44
代理机构 代理人
主权项 1. A method for detecting at least one defect within a test object, comprising the steps: (a) determining a plurality of measurement data sets (MDS) of the test object comprising: for each measurement data set, isonating an ultrasound signal respectively at various measurement points (MP) into the test object, with a selected insonation angle (α), in order to determine a measurement data set (MDS);selectively varying the insonation angle for each measurement data set (MDS) for the determination of the measurement data sets (MDS); (b) carrying out a SAFT (Synthetic Aperture Focusing Technique) evaluation for each measurement data set (MDS), wherein the evaluation is determined by using a common reconstruction grid (RG) within the test object for calculating an SAFT evaluation result for each measurement data set (MDS); and (c) superposing the calculated SAFT evaluation results, in order to calculate an orientation-independent defect display value (SRP)) for each reconstruction point (RP) of the reconstruction grid (RG).
地址 München DE