发明名称 ANNEALING FOR DAMAGE FREE LASER PROCESSING FOR HIGH EFFICIENCY SOLAR CELLS
摘要 Annealing solutions providing damage-free laser patterning utilizing auxiliary heating to anneal laser damaged ablation regions are provided herein. Ablation spots on an underlying semiconductor substrate are annealed during or after pulsed laser ablation patterning of overlying transparent passivation layers.
申请公布号 US2015056742(A1) 申请公布日期 2015.02.26
申请号 US201414265331 申请日期 2014.04.29
申请人 Solexel, Inc. 发明人 Rana Virendra V.;Moslehi Mehrdad M.;Kapur Pawan;Rattle Benjamin;Deshazer Heather;Coutant Solene
分类号 H01L31/18;H01L31/0236 主分类号 H01L31/18
代理机构 代理人
主权项 1. A method for patterning an electrically insulating layer on a semiconductor substrate, said method comprising: providing a semiconductor substrate having n-type doping; depositing a first layer of borosilicate glass or a borosilicate/undoped glass stack on said semiconductor substrate; selectively ablating said first layer of borosilicate glass or borosilicate/undoped glass stack with a pulsed laser in a first emitter ablation pattern comprising a plurality of first ablation spots; annealing said first ablation spots; depositing a second layer of borosilicate glass or a borosilicate/undoped glass stack on said first layer of borosilicate glass or a borosilicate/undoped glass stack; selectively ablating said second layer of borosilicate glass or borosilicate/undoped glass stack with a pulsed laser in a second base ablation pattern comprising a plurality of second ablation spots; and, annealing said second ablation spots.
地址 Milpitas CA US