发明名称 |
NITRIDE SEMICONDUCTOR DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a nitride semiconductor device which can decrease the occurrence of breaking of a contact part which is connected to a source electrode and a drain electrode.SOLUTION: A nitride semiconductor device comprises: first source contact parts (21A) formed on a partial region of each source electrode (11) and an insulation film; and first drain contact parts (22A) formed on a partial region of each drain electrode (12) and the insulation film. The first source contact parts (21A) lie on a central part of the source electrode (11) in a longer direction. The first drain contact parts (22A) lie on a central part of the drain electrode (12) in a longer direction.</p> |
申请公布号 |
JP2015038935(A) |
申请公布日期 |
2015.02.26 |
申请号 |
JP20130169634 |
申请日期 |
2013.08.19 |
申请人 |
SHARP CORP |
发明人 |
UETANI YOSHIHIRO;SUZUKI TAKAMITSU;NAGAHISA TETSUZO |
分类号 |
H01L21/338;H01L21/28;H01L21/3205;H01L21/768;H01L21/822;H01L23/522;H01L27/04;H01L29/778;H01L29/812 |
主分类号 |
H01L21/338 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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