发明名称 DEFECT INSPECTION DEVICE, OPTICAL MEMBER MANUFACTURING SYSTEM, AND OPTICAL DISPLAY DEVICE PRODUCTION SYSTEM
摘要 <p>A defect inspection device for an optical member including a polarizer includes a light source, an imaging device for imaging an image produced by transmitted light from the optical member, a first polarizing filter that is disposed on an optical path between the light source and the optical member and has a first absorption axis, a second polarizing filter that is disposed on an optical path between the imaging device and the optical member and has a second absorption axis, a first movement device for moving the first polarizing filter forward and backward in relation to the optical path between the light source and the optical member, and a second movement device for moving the second polarizing filter forward and backward in relation to the optical path between the imaging device and the optical member.</p>
申请公布号 WO2015025703(A1) 申请公布日期 2015.02.26
申请号 WO2014JP70546 申请日期 2014.08.05
申请人 SUMITOMO CHEMICAL COMPANY, LIMITED 发明人 HASHIGUCHI DAISUKE;KASHU KOJI
分类号 G01N21/892;G01N21/88;G01N21/896;G02B5/30;G02F1/13;G02F1/1335 主分类号 G01N21/892
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