发明名称 |
DEFECT INSPECTION DEVICE, OPTICAL MEMBER MANUFACTURING SYSTEM, AND OPTICAL DISPLAY DEVICE PRODUCTION SYSTEM |
摘要 |
<p>A defect inspection device for an optical member including a polarizer includes a light source, an imaging device for imaging an image produced by transmitted light from the optical member, a first polarizing filter that is disposed on an optical path between the light source and the optical member and has a first absorption axis, a second polarizing filter that is disposed on an optical path between the imaging device and the optical member and has a second absorption axis, a first movement device for moving the first polarizing filter forward and backward in relation to the optical path between the light source and the optical member, and a second movement device for moving the second polarizing filter forward and backward in relation to the optical path between the imaging device and the optical member.</p> |
申请公布号 |
WO2015025703(A1) |
申请公布日期 |
2015.02.26 |
申请号 |
WO2014JP70546 |
申请日期 |
2014.08.05 |
申请人 |
SUMITOMO CHEMICAL COMPANY, LIMITED |
发明人 |
HASHIGUCHI DAISUKE;KASHU KOJI |
分类号 |
G01N21/892;G01N21/88;G01N21/896;G02B5/30;G02F1/13;G02F1/1335 |
主分类号 |
G01N21/892 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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