发明名称 METHOD FOR MANUFACTURING MASK BLANK AND MEHTOD FOR MANUFACTURING PHOTOMASK
摘要 <p>A manufacturing method of a mask blank and manufacturing method of a photomask are provided to prevent that smudge is drawn in a starting area of the coating film and prevent problems caused by the surface state, states of the starting place in coating. A manufacturing method of the mask blank having a resist film comprises processes: preparing for a substrate(10) having a thin film(11) for forming the mask pattern on the domain excluding a circumference portion following the periphery of the major surface of substrate; deciding the open surface of the circumference portion following the periphery of the major surface of substrate as the contact liquid initiation place; starting the contact liquid when interval of the open surface and the tip-end part of the spreading nozzle(22) is relatively small; and broadening the interval of the open surface and the tip-end part of the spreading nozzle(22) with the relatively big state and completing the contact liquid.</p>
申请公布号 KR101487550(B1) 申请公布日期 2015.02.26
申请号 KR20080054946 申请日期 2008.06.12
申请人 发明人
分类号 G03F1/50;G03F1/54;G03F7/16;H01L21/027 主分类号 G03F1/50
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