发明名称 SUBSTRATE INSPECTING METHOD AND SUBSTRATE INSPECTING SYSTEM USING SAME
摘要 To inspect a substrate, the substrate, before a component is provided on a mounter, is first transferred to a work stage. Then, the warpage of the substrate is inspected. Next, the substrate is transferred to the mounter if it is determined that the substrate is good according to the inspection result, and the substrate is confirmed as being defective without transferring the substrate to the mounter if it is determined that the substrate is defective according to the inspection result. Thus, unnecessary work can be prevented, and the productivity of a product and inspection efficiency can be increased.
申请公布号 WO2015026212(A1) 申请公布日期 2015.02.26
申请号 WO2014KR07880 申请日期 2014.08.25
申请人 KOH YOUNG TECHNOLOGY INC. 发明人 KIM, HEE-TAE;AHN, YONG-KEUN;CHA, WON-JAE
分类号 H05K13/08 主分类号 H05K13/08
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