发明名称 |
Capacitor and Semiconductor Device |
摘要 |
A semiconductor device has an insulating surface provided with a transistor and a capacitor. The transistor includes a gate electrode, an oxide semiconductor film overlapping with the gate electrode, a gate insulating film between the gate electrode and the oxide semiconductor film, and a first conductive film serving as a pair of electrodes in contact with the oxide semiconductor film. An oxide insulating film in contact with the oxide semiconductor film, a metal oxide film over the oxide insulating film, and a second conductive film serving as a pixel electrode which is in an opening in the metal oxide film and is in contact with the first conductive film are provided. The capacitor includes a film having conductivity over the gate insulating film, the second conductive film, and the metal oxide film provided between the film having conductivity and the second conductive film. |
申请公布号 |
US2015053973(A1) |
申请公布日期 |
2015.02.26 |
申请号 |
US201414462994 |
申请日期 |
2014.08.19 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Yamazaki Shunpei;Koezuka Junichi;Katayama Masahiro;Jintyou Masami |
分类号 |
H01L27/12;H01L29/786;H01L49/02 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
1. A capacitor comprising:
a film containing indium and a metal element selected from aluminum, gallium, yttrium, zirconium, lanthanum, cerium, and neodymium; a metal oxide film over the film; and a light-transmitting conductive film over the metal oxide film. |
地址 |
Kanagawa-ken JP |