| 摘要 |
<p>The present invention discloses a microelectrode circuit testing pin. The microelectrode circuit testing pin according to an embodiment of the present invention includes: a pin which has a contact unit formed on one or both ends and an elastic unit connecting both ends; and a housing which has a through unit exposing the contact unit to the outside while covering the elastic unit. The pin and the housing are simultaneously formed through a semiconductor MEMS process, and at least one of the upper or lower surface of the pin and the housing can be flat.</p> |
