发明名称 Scanning apparatus with patterned probe light
摘要 <p>Disclosed is a 3D scanner for recording the 3D topography of an object, the 3D scanner comprising: - an illumination unit configured for providing probe light for illuminating the object, where the probe light comprises a pattern of light rays; - an image sensor for acquiring one or more 2D images of light rays returning from the illuminated object; - an optical system comprising an optical element arranged such that the patterned probe light passes through it when propagating towards the object from the illumination unit along an optical path; and - a device for changing the configuration of the optical system between a first and a second configuration, where the change in configuration comprises a change in orientation of the optical element between a first orientation and a second orientation relative to the optical path of the probe light such that the change of configuration provides a shift in the position of the probe light pattern on the illuminated object.</p>
申请公布号 EP2840353(A1) 申请公布日期 2015.02.25
申请号 EP20140173233 申请日期 2014.06.20
申请人 3SHAPE A/S 发明人 ROSBERG, CHRISTIAN ROMER;ESBECH, BO
分类号 G01B11/25 主分类号 G01B11/25
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