发明名称 |
III nitride crystal substrate and light-emitting device |
摘要 |
Toward making available III nitride crystal substrates advantageously employed in light-emitting devices, and light-emitting devices incorporating the substrates, a III nitride crystal substrate has a major face whose surface area is not less than 10 cm2 and is characterized by: edge dislocations in the crystal being concentrated along propagation lines forming an angle of some 0° to 5° with a given {0001} plane of the crystal; screw dislocations in the crystal being concentrated along propagation lines forming an angle of some 45° to 60° with the given {0001} plane; and in a major-face principal region excluding the peripheral margin of the major face from its outer periphery to a 5 mm separation from its outer periphery, the total dislocation density being between 1×104 cm−2 to 3×106 cm−2 inclusive, and the ratio of screw-dislocation density to the total dislocation density being 0.5 or greater. |
申请公布号 |
US8963166(B2) |
申请公布日期 |
2015.02.24 |
申请号 |
US201314010558 |
申请日期 |
2013.08.27 |
申请人 |
Sumitomo Electric Industries, Ltd. |
发明人 |
Fujiwara Shinsuke;Yoshida Hiroaki |
分类号 |
H01L33/00;H01L29/32;C30B19/02;C30B23/02;C30B25/02;C30B29/40;H01L21/02;H01L33/02 |
主分类号 |
H01L33/00 |
代理机构 |
Ostrolenk Faber LLP |
代理人 |
Ostrolenk Faber LLP |
主权项 |
1. A Group-III nitride crystal substrate having a major face whose surface area is not less than 10 cm2, the III-nitride crystal substrate characterized by:
edge dislocations in the crystal being concentrated along propagation lines forming an angle of some 0° to 5° with a given {0001} plane of the crystal; screw dislocations in the crystal being concentrated along propagation lines forming an angle of some 45° to 60° with the given {0001} plane; and in a major-face principal region excluding the peripheral margin of the major face from its outer periphery to a 5 mm separation from its outer periphery, the total dislocation density being between 1×104 cm−2 and 3×106 cm−2 inclusive, and the ratio of screw-dislocation density to the total dislocation density being 0.5 or greater. |
地址 |
Osaka JP |