发明名称 Fractional bits in memory cells
摘要 Methods, devices, modules, and systems for programming memory cells can include storing charges corresponding to a data state that represents an integer number of bits in a set of memory cells. Programming memory cells can include storing a charge in a cell of the set, where the charge corresponds to a programmed state, where the programmed state represents a fractional number of bits, and where the programmed state denotes a digit of the data state as expressed by a number in base N, where N is equal to 2B, rounded up to an integer, and where B is equal to the fractional number of bits represented by the programmed state.
申请公布号 US8964465(B2) 申请公布日期 2015.02.24
申请号 US201314020523 申请日期 2013.09.06
申请人 Micron Technology, Inc. 发明人 Radke William H.
分类号 G11C16/04;G11C11/56;G11C29/00 主分类号 G11C16/04
代理机构 Brooks, Cameron & Huebsch, PLLC 代理人 Brooks, Cameron & Huebsch, PLLC
主权项 1. An apparatus, comprising: a set of memory cells; and circuitry to: sense each memory cell of the set of memory cells to determine a respective threshold level for each memory cell of the set, wherein the threshold level for a respective memory cell of the set corresponds to a non-integer number of bits of data stored in the respective memory cell and denotes a respective digit of a data state as expressed by a number in base N, where N is equal to 2B, rounded up to an integer, and where B is equal to the non-integer number of bits represented by the threshold level; andoutput an integer number of bits of data representing a combination of the threshold levels for the set and comprising the data state.
地址 Boise ID US