发明名称 Thin-film transistor, fabrication method thereof, and image display device
摘要 A method for fabricating a thin-film transistor is provided whereby isolation of transistor devices is realized and the performance and the stability of the product thin-film transistor are improved. The thin-film transistor includes a substrate; a gate electrode laminated on the substrate; a gate insulating layer laminated on the substrate and the gate electrode; a recessed portion provided in the gate insulating layer; a semiconductor layer formed in the recessed portion of the gate insulating layer; and a source electrode and a drain electrode connected to the semiconductor layer at respective positions which are spaced apart from each other.
申请公布号 US8963141(B2) 申请公布日期 2015.02.24
申请号 US201313786039 申请日期 2013.03.05
申请人 Toppan Printing Co., Ltd. 发明人 Murata Kodai
分类号 H01L35/24;H01L51/00;H01L29/786;H01L27/12;H01L51/05;H01L29/66 主分类号 H01L35/24
代理机构 Squire Patton Boggs (US) LLP 代理人 Squire Patton Boggs (US) LLP
主权项 1. A top-contact type thin-film transistor comprising: a substrate; a gate electrode laminated on the substrate; a gate insulating layer laminated on the substrate and the gate electrode; a recessed portion provided in the gate insulating layer; a semiconductor layer formed in the recessed portion of the gate insulating layer, wherein the semiconductor layer exists only within the recessed portion; and a source electrode and a drain electrode, both the source electrode and the drain electrode connected to the semiconductor layer at respective positions which are spaced apart from each other.
地址 JP