发明名称 |
Thin-film transistor, fabrication method thereof, and image display device |
摘要 |
A method for fabricating a thin-film transistor is provided whereby isolation of transistor devices is realized and the performance and the stability of the product thin-film transistor are improved. The thin-film transistor includes a substrate; a gate electrode laminated on the substrate; a gate insulating layer laminated on the substrate and the gate electrode; a recessed portion provided in the gate insulating layer; a semiconductor layer formed in the recessed portion of the gate insulating layer; and a source electrode and a drain electrode connected to the semiconductor layer at respective positions which are spaced apart from each other. |
申请公布号 |
US8963141(B2) |
申请公布日期 |
2015.02.24 |
申请号 |
US201313786039 |
申请日期 |
2013.03.05 |
申请人 |
Toppan Printing Co., Ltd. |
发明人 |
Murata Kodai |
分类号 |
H01L35/24;H01L51/00;H01L29/786;H01L27/12;H01L51/05;H01L29/66 |
主分类号 |
H01L35/24 |
代理机构 |
Squire Patton Boggs (US) LLP |
代理人 |
Squire Patton Boggs (US) LLP |
主权项 |
1. A top-contact type thin-film transistor comprising:
a substrate; a gate electrode laminated on the substrate; a gate insulating layer laminated on the substrate and the gate electrode; a recessed portion provided in the gate insulating layer; a semiconductor layer formed in the recessed portion of the gate insulating layer, wherein the semiconductor layer exists only within the recessed portion; and a source electrode and a drain electrode, both the source electrode and the drain electrode connected to the semiconductor layer at respective positions which are spaced apart from each other. |
地址 |
JP |