Three-dimensional measurement apparatus, method for three-dimensional measurement, and computer program

摘要

On the basis of captured images at the time of projecting multiple-frequency slit-shaped light patterns having no overlapping edge positions onto an object, the edge portions of the slit-shaped light patterns are identified. When the edge portions overlap in the captured images of two or more slit-shaped light patterns, the reliability of the computed distance values of the positions corresponding to the edges is lowered.

主权项

1. An apparatus comprising:
a protection unit configured to protect a plurality of patterns having a light and dark stripe portion onto an object; an obtaining unit configured to obtain a plurality of capture images of an object onto which each pattern is projected by the projection unit; an edge position detecting unit configured to detect an edge which indicates a boundary between light and dark portions of each pattern in each captured image; a counting unit configured to count a number of an edge pixel including the detected edge at a corresponding position in each captured image; a determination unit configured to determine a number of the detected edge pixels counting by the counting unit in the corresponding position in each captured image is one; and a deriving unit configured to derive a position of the object based on the edge positions and a result of determination by the determination unit.