发明名称 |
Semiconductor device with self-aligned air gap and method for fabricating the same |
摘要 |
A method for fabricating a semiconductor device includes forming a plurality of semiconductor structures over a substrate, forming an interlayer dielectric layer over the semiconductor structures, etching the interlayer dielectric layer, and defining open parts between the semiconductor structures to expose a surface of the substrate, forming sacrificial spacers on sidewalls of the open parts, forming conductive layer patterns in the open parts, and causing the conductive layer patterns and the sacrificial spacers to reach each other, and defining air gaps on the sidewalls of the open parts. |
申请公布号 |
US8962472(B2) |
申请公布日期 |
2015.02.24 |
申请号 |
US201313844915 |
申请日期 |
2013.03.16 |
申请人 |
SK Hynix Inc. |
发明人 |
Rho Il-Cheol;Lee Jong-Min |
分类号 |
H01L21/764;H01L29/92;H01L27/108 |
主分类号 |
H01L21/764 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A method for fabricating a semiconductor device, comprising:
forming a plurality of semiconductor structures over a substrate; defining open parts between the semiconductor structures; forming sacrificial spacers over sidewalls of the open parts; forming conductive layer patterns in the open parts; and reacting the conductive layer patterns and the sacrificial spacers with each other, thereby defining air gaps on the sidewalls of the open parts. |
地址 |
Gyeonggi-do KR |