Universal test system for testing electrical and optical hosts

摘要

According to an example implementation, a universal tester includes a host interface slot connected to a first pluggable host card during an electrical test mode of operation to provide a stressed electrical signal to a host under test. The host interface slot is connected to a second pluggable host card during an optical test mode of operation, the second pluggable host card including an electrical-optical conversion block to convert a stressed electrical signal to a stressed optical signal that is provided to a host under test. A stressor generator may operation in pass-through mode or a loop-back mode.

主权项

1. A universal tester comprising:
a host interface slot connected to a first pluggable host card during an electrical test mode of operation to provide a stressed electrical signal to a host under test; the host interface slot connected to a second pluggable host card during an optical test mode of operation, the second pluggable host card including an electrical-optical conversion block to convert a stressed electrical signal to a stressed optical signal that is provided to the host under test; and a stressor generator coupled to a first connector and to the host interface slot, the stressor generator receives an electrical signal from the first connector and generates the stressed electrical signal that is output to the host interface slot during a pass-through mode for the stressor generator, the stressor generator also receives an electrical signal from the host interface slot and generates the stressed electrical signal that is output to the host interface slot during a loop-back mode for the stressor generator.