| 摘要 |
<p>According to the present invention there is provided an assembly for testing performance of a component, the assembly comprising, a rotatable turret which comprises a plurality of component handling heads each of which can hold a component; a rotatable head assembly, the rotatable head assembly comprising, a rotatable head, wherein the rotatable head comprises one or more nests, each of which has an electrical contact, and each of which is suitable for receiving a component such that the component can electrically connect to the electrical contact of that nest; wherein the nest is further configured such that it can hold a component such that the component remains electrically connected to the electrical contact, as the rotatable head rotates; wherein the rotatable head is arranged to be adjacent the turret so that a component can be passed directly from a component handling head on the rotatable turret to a nest on the rotatable head; a processor which is arranged in electrical communication with the electrical contact(s) of the one or more nests on the rotatable head such that the processor can, both, send command signals to a component held in a nest which cause the component to operate in a predefined manner, and receive response signals from the component which are generated by the component when the component operates in the predefined manner, while the component is rotated by the rotatable head, and wherein the processor is configured to determine the performance of the component from the response signals it receives. There is further provided a corresponding method.</p> |
