发明名称 Specimen analysis apparatus and control method thereof
摘要 <p>According to an embodiment of the present invention, a specimen analysis apparatus comprises: a sensor unit to sense the location of a specimen analysis kit; an image photographing unit; and a control unit receiving a sensing value from the sensor unit, photographing reaction area which a specimen injected to the specimen analysis kit through the image photographing unit flows in, and distinguishing whether a specific pattern exists or not based on a photographed image about the reaction area.</p>
申请公布号 KR101494526(B1) 申请公布日期 2015.02.23
申请号 KR20130066450 申请日期 2013.06.11
申请人 发明人
分类号 G01N21/75;G01N33/53;G01N35/00 主分类号 G01N21/75
代理机构 代理人
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