发明名称 |
THIN-FILM TRANSISTOR ARRAY SUBSTRATE, DISPLAY DEVICE INCLUDING THE SAME, AND METHOD OF MANUFACTURING THE THIN-FILM TRANSISTOR ARRAY SUBSTRATE |
摘要 |
A method of manufacturing a thin film transistor (TFT) array substrate is disclosed. In one aspect, the method includes forming an active layer on a substrate, forming a first insulating layer on the substrate to cover the active layer, and forming a first gate electrode on the first insulating layer in an area corresponding to the active layer, doping the active layer with ion impurities, forming a second insulating layer on the first insulating layer to cover the first gate electrode, performing an annealing process on the active layer, forming a lower electrode of a capacitor on the second insulating layer, forming a third insulating layer on the second insulating layer to cover the lower electrode, wherein the third insulating layer has a dielectric constant that is greater than those of the first and second insulating layers, and forming an upper electrode of the capacitor on the third insulating layer. |
申请公布号 |
US2015048320(A1) |
申请公布日期 |
2015.02.19 |
申请号 |
US201414243694 |
申请日期 |
2014.04.02 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
Lee Jeong-Ho;Sim Su-Yeon;Yoon Ju-Won;Lee Seung-Min;Lee Wang-Woo;Lee Il-Jeong;Lee Jung-Kyu;Im Choong-Youl |
分类号 |
H01L27/12;H01L27/32 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a thin film transistor (TFT) array substrate, comprising:
forming an active layer over a substrate; forming a first insulating layer over the substrate to cover the active layer; forming a first gate electrode over the first insulating layer, wherein the first gate electrode is formed substantially directly above at least a portion of the active layer; doping the active layer with ion impurities; forming a second insulating layer over the first insulating layer to cover the first gate electrode; performing an annealing process on the active layer; forming a lower electrode of a capacitor over the second insulating layer; forming a third insulating layer over the second insulating layer to cover the lower electrode, wherein the third insulating layer has a dielectric constant greater than those of the first and second insulating layers; and forming an upper electrode of the capacitor over the third insulating layer. |
地址 |
Yongin-City KR |