发明名称 |
THERMAL TREATMENT DEVICE AND FILM FORMATION SYSTEM |
摘要 |
<p>PROBLEM TO BE SOLVED: To properly perform thermal treatment of a substrate while achieving a small supply amount of an inactive gas which is supplied when the thermal treatment of the substrate is performed.SOLUTION: A first thermal treatment device 30 includes: a heating plate 120 which holds a wafer W and performs thermal treatment; a lid 140 which is provided above the heating plate 120 and is integrated with the heating plate 120 to form a thermal treatment chamber K in which the wafer W is housed and the thermal treatment is performed to the wafer W; a gas supply mechanism 150 which supplies an inactive gas to the thermal treatment chamber K; a decompression mechanism 160 which decompresses the atmosphere in the thermal treatment chamber K to a predetermined degree of vacuum; and a seal material 141 which is annularly provided between an upper surface of the heating plate 120 and a lower surface of the lid 140 and is used for maintaining the airtightness in the thermal treatment chamber K.</p> |
申请公布号 |
JP2015035586(A) |
申请公布日期 |
2015.02.19 |
申请号 |
JP20140106089 |
申请日期 |
2014.05.22 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
TERADA SHOJI;HARA SHOGO;MOTODA KIMIO |
分类号 |
H01L21/027;B05C9/14;H01L21/31 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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