发明名称 |
METHOD FOR DETERMINING A CONDITION INDICATOR OF AN APPARATUS |
摘要 |
A method for determining a condition indicator of an apparatus includes providing an apparatus configured to measure at least two different technical parameters. A respective parameter value is determined for each of the at least two different technical parameters of the apparatus using at least one sensor configured to determine a respective parameter value for each of the at least two different technical parameters. A respective deviation value of each of the parameter values is determined with respect to an associated respective parameter reference value for each of the technical parameters. A respective deviation relevance value is determined from each of the deviation values using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other. Using an indicator function, a condition indicator is calculated from the determined deviation relevance values. An overall condition of the apparatus is calculated using the condition indicator. |
申请公布号 |
US2015051844(A1) |
申请公布日期 |
2015.02.19 |
申请号 |
US201414291002 |
申请日期 |
2014.05.30 |
申请人 |
HACH LANGE GMBH |
发明人 |
STREPPEL TOON;SEEHAUS TORSTEN;SCHMITZ ULRICH;BATTEFELD MANFRED;THOMAS FRANK;KUSSMANN MICHAEL;HAECK MICHAEL |
分类号 |
G01N33/18;G01N25/56 |
主分类号 |
G01N33/18 |
代理机构 |
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代理人 |
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主权项 |
1. A method for determining a condition indicator of an apparatus, the method comprising:
providing an apparatus configured to measure at least two different technical parameters; determining a respective parameter value for each of the at least two different technical parameters of the apparatus using at least one sensor configured to determine a respective parameter value for each of the at least two different technical parameters; determining a respective deviation value of each of the parameter values with respect to an associated respective parameter reference value for each of the technical parameters; determining a respective deviation relevance value from each of the deviation values using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other; calculating, using an indicator function, a condition indicator from the determined deviation relevance values; and determining an overall condition of the apparatus using the condition indicator. |
地址 |
BERLIN DE |