THREE-DIMENSIONAL MEASURING APPARATUS, THREE-DIMENSIONAL MEASURING METHOD, AND THREE-DIMENSIONAL MEASURING PROGRAM

摘要

A three-dimensional measuring apparatus 1 projects slit light from a projector 7 onto a work 2 and a stereo camera 5 captures an image of the work projected by the slit light. A control apparatus 10 of the three-dimensional measuring apparatus 1 temporarily identifies a correspondence between a bright line 4j on a first image of the captured stereo image and a light-section plane 6Pj and projects the bright line 4j onto the light-section plane 6Pj. The bright line projected onto the light-section plane 6Pj is projected onto a second image. The control apparatus 10 calculates the level of similarity between a bright line 4jX projected onto the second image and a bright line on the second image and determines a result of identified correspondence relationship between the bright line 4jX and the bright line on the second image.

主权项

1. A three-dimensional measuring apparatus comprising:
a projector configured to project slit light onto a work; a first camera configured to capture an image of the work projected by the slit light; a second camera configured to capture an image of the work projected by the slit light from a position different from that of the first camera; and a control apparatus configured to store a three-dimensional plane equation of a light-section plane of the slit light, identify a correspondence among a bright line generated on a first image captured by the first camera by projecting the slit light, a bright line generated on a second image captured by the second camera by projecting the slit light, and the three-dimensional plane equation of the light-section plane, and perform three-dimensional measuring of the work by a principle of triangulation by using a correspondence relationship among any of the bright line on the first image, the bright line on the second image, and the light-section plane.