THERMAL INTERFACE MATERIAL LAYER AND PACKAGE-ON-PACKAGE DEVICE COMPRISING THERMAL INTERFACE MATERIAL LAYER
摘要
Provided are a thermal interface material layer and a package-on-package device comprising a thermal interface material layer. The package-on-package device may comprise a thermal interface material layer arranged between an upper semiconductor package and a lower semiconductor package, and configured to have specific physical properties. Therefore, when performing solder ball welding to install the upper semiconductor package on the lower semiconductor package, cracking within the lower semiconductor chip can be prevented.
申请公布号
WO2015022563(A1)
申请公布日期
2015.02.19
申请号
WO2013IB56575
申请日期
2013.08.12
申请人
SAMSUNG ELECTRONICS CO., LTD
发明人
NA, MIN-OK;KIM, JONGKOOK;RYU, HYO-CHANG;PARK, JIN-WOO;SON, BONGJIN;LEE, JANG WOO