发明名称 METHOD OF FORMING SEMICONDUCTOR DEVICE HAVING MULTILAYERED PLUG AND RELATED DEVICE
摘要 A semiconductor pattern is formed on a substrate. An interlayer insulating layer is formed on the semiconductor pattern. A contact hole in the interlayer insulating layer is formed the semiconductor pattern is exposed. A lower plug is formed in the contact hole by a selective epitaxial growth (SEG) process. An upper plug is formed in the contact hole on the lower plug by alternately and repeatedly performing a deposition process and an etching process.
申请公布号 US2015050805(A1) 申请公布日期 2015.02.19
申请号 US201414200798 申请日期 2014.03.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH HYOUNG-WON;Lim Tae-Jin;Hong Tae-Ki
分类号 H01L21/768 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method of forming a semiconductor device, comprising: forming a semiconductor pattern on a substrate; forming an interlayer insulating layer on the semiconductor pattern; forming a contact hole in the interlayer insulating layer exposing the semiconductor pattern; forming a lower plug in the contact hole by a selective epitaxial growth (SEG) process; and forming an upper plug in the contact hole on the lower plug by alternately and repeatedly performing a deposition process and an etching process.
地址 Gyeonggi-do KR