发明名称 半導体装置の製造方法
摘要 <p>A method of manufacturing a semiconductor device includes: forming a cap insulating film, including Si and C, on a substrate; forming an organic silica film, having a composition ratio of the number of carbon atoms to the number of silicon atoms higher than that of the cap insulating film, on the cap insulating film; and forming two or more concave portions, having different opening diameters, in the organic silica film, by plasma processing in which mixed gas including inert gas, N-containing gas, fluorocarbon gas and oxidant gas is used.</p>
申请公布号 JP5671253(B2) 申请公布日期 2015.02.18
申请号 JP20100107698 申请日期 2010.05.07
申请人 发明人
分类号 H01L21/3065;C23C16/505;H01L21/312;H01L21/3205;H01L21/768;H01L23/522;H01L23/532 主分类号 H01L21/3065
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