| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an optical specimen detection device capable of measuring the ATR (attenuated total reflectance) condition of an SPR (surface plasmon resonance) device and an SPFS (surface plasmon-field enhanced fluorescence spectroscopy) device without rotatably moving a projection unit, performing highly accurate measurement without being affected by vibration noise etc., and rapidly performing the measurement. <P>SOLUTION: An optical specimen detection device, on which a sensor chip having a metallic thin film formed on a dielectric member is mounted and which detects a specimen by radiating excitation light, includes: a condenser lens for condensing the excitation light to be made incident to the dielectric member; and a point light source for irradiating the metallic thin film with the excitation light via the condenser lens and the dielectric member from a projection position at the front focal distance of the condenser lens. When the incident angle of the excitation light with respect to the metallic thin film is changed, the point light source is linearly moved within a plane vertical to the optical axis of the condenser lens. <P>COPYRIGHT: (C)2012,JPO&INPIT</p> |
