发明名称 |
Graded band gap pn homojunction formation method in silicon |
摘要 |
<p>The invention relates to technical physics and can be used in the production of light-absorbing and light-emitting semiconductor devices. The technical problem solved by the present invention is to develop a simple method for formation of a graded band gap p-n homojunction in silicon, which effectively absorbs and emits light in a broad spectral range, including visible light. The method for formation of a graded band gap p-n homojunction in silicon comprises a step of formation of a p-n junction in a p-type conductivity silicon monocrystal having a resistivity of 1 to 10 ©€¢cm, surface roughness of the monocrystal being less than 1.6 nm, by irradiating its surface with a laser radiation with an absorption coefficient in silicon no less than 10 6 cm -1 , the laser radiation doses being between 30 and 750 mJ/cm 2 , and the length of the pulses being between 1 and 10 ns, to form a graded band gap p-n homojunction with a thickness of the n-type layer equal to or less than 26 nm on the surface layer of the silicon monocrystal.</p> |
申请公布号 |
EP2838120(A1) |
申请公布日期 |
2015.02.18 |
申请号 |
EP20130180134 |
申请日期 |
2013.08.12 |
申请人 |
RIGAS TEHNISKA UNIVERSITATE |
发明人 |
MEDVIDS, ARTURS;ONUFRIJEVS, PAVELS;DAUKSTA, EDVINS;MEZINSKIS, GUNDARS |
分类号 |
H01L31/028;H01L21/20;H01L31/0352;H01L31/068;H01L31/103;H01L31/18 |
主分类号 |
H01L31/028 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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