| 发明名称 | Method and system for determining the quality of a storage system | ||
| 摘要 | In accordance with an exemplary embodiment of the present invention, a method for measuring a quality parameter of an optical storage system comprising a non-diffraction-limited optical storage medium and a readout device, the method comprising the process of deriving an impulse response of the optical storage system, and the process of analyzing the impulse response to determine at least one of a width of the impulse response and a skewness of the impulse response as the quality parameter. | ||
| 申请公布号 | US8958274(B2) | 申请公布日期 | 2015.02.17 |
| 申请号 | US201113820543 | 申请日期 | 2011.09.06 |
| 申请人 | Thomson Licensing | 发明人 | Hepper Dietmar;Theis Oliver;Chen Xiaoming;Hoelzemann Herbert;Pilard Gael |
| 分类号 | G11B17/00;G11B20/18;G11B7/1267;G11B7/24;G11B20/20;G11B20/10 | 主分类号 | G11B17/00 |
| 代理机构 | Jack Schwartz & Associates, PLLC | 代理人 | Jack Schwartz & Associates, PLLC |
| 主权项 | 1. A readout-device-implemented method for measuring a quality parameter of an optical storage system, the storage system comprising the readout device and a non-diffraction-limited optical storage medium carrying predefined data, the method comprising: deriving, by the readout device, based on a readout of the predefined data, an impulse response of the optical storage system as a sequence of impulse response samples; and analyzing, by the readout device, the impulse response to determine as the quality parameter a width of the impulse response by evaluating a second-order central moment of squares of the impulse response samples. | ||
| 地址 | FR | ||