发明名称 |
Semiconductor device and method for making the same |
摘要 |
A semiconductor device includes: a substrate having a base and an array of semiconductor pillars extending from the base, the substrate being formed with a plurality of trenches, each of which extends into the base and has two opposing trench side walls; a first insulative liner layer formed on each of the trench side walls of each of the trenches and divided into upper and lower segments by a gap that leaves a bit-forming surface of each of the trench side walls uncovered by the first insulative liner layer; and a plurality of buried bit lines, each of which extends into the base from the bit-forming surface of a respective one of the trench side walls of each of the trenches. |
申请公布号 |
US8956961(B2) |
申请公布日期 |
2015.02.17 |
申请号 |
US201213415959 |
申请日期 |
2012.03.09 |
申请人 |
Rexchip Electronics Corporation |
发明人 |
Takesako Kazuaki;Hsu Wen-Kuei;Tanaka Yoshinori;Nagai Yukihiro;Hsiung Chih-Wei;Fujita Hirotake;Kadoya Tomohiro;Liu Wei-Chih;Fang Hsuan-Yu;Huang Yu-Ling;Chen Meng-Hsien;Tseng Chun-Chiao;Ai Chung-Yung;Hsu Yu-Shan;Chang Wei-Che;Huang Chun-Hua |
分类号 |
H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
Occhiuti & Rohlicek LLP |
代理人 |
Occhiuti & Rohlicek LLP |
主权项 |
1. A method for making a semiconductor device, comprising:
(a) forming a plurality of trenches in a substrate; (b) forming a first insulative liner layer on two opposing trench side walls of each of the trenches; (c) partially covering the first insulative liner layer with a bit-controlling material such that only an upper segment of the first insulative liner layer on each of the trench side walls is uncovered by the bit-controlling material; (d) forming a second insulative liner layer on the upper segment of the first insulative liner layer on each of the trench side walls, the second insulative liner layer being made from a material different from those of the first insulative liner layer and the bit-controlling material; (e) removing atop portion of the bit-controlling material and an intermediate segment of the first insulative liner layer that is covered by the top portion of the bit-controlling material so as to uncover a bit-forming surface of each of the trench side walls; and (f) diffusing a dopant into the substrate through the bit-forming surface to form a buried bit line that extends inwardly from the bit-forming surface into each of the trench side walls. |
地址 |
Taichung TW |