SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE TEST METHOD

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor device effective for shortening test time.SOLUTION: A bank constituting a semiconductor storage device includes, as constituent elements: memory cells; read/write amplifier circuit 151-1; a data line MIO connected between the memory cells and the read/write amplifier circuit 151-1; a terminal DQ; a data line GBUS connected between the read/write amplifier circuit 151-1 and the terminal DQ; a data determination circuit 41 configured to output data on one of first and second logical values in response to data of each of the data line MIO and the data line GBUS; and a data generation circuit 42 configured to generate the data on the logical value of one of the first and second logical values on the data line MIO in response to the data output from the data determination circuit 41 and the data on the data line GBUS.