| 摘要 |
<p>An apparatus for inspecting the axis arrangement of a multi-axis optical system comprises: a common target block (10) which forms a target from different wavelength bands; and an arc-shaped scope block (20) which reflects light in parallel toward an inspection optical device (100) where optical axis error arrangement is performed in order to form a path without any influence of parallax. The apparatus can inspect the optical axis arrangement of a multi-wavelength complex optical system by obtaining a central pixel position coordinate of a cross line based on the target for band 1 and band 2 images obtained from the inspection optical device (100), and then by calculating an arrangement error of two optical systems from a known field of view (FOV) and the number of pixels on a displayer, and can be easily manufactured at low prices and with mobility.</p> |
