发明名称 |
Method For Preparing Scandium-Doped Hafnium Oxide Film |
摘要 |
A method for preparing scandium-doped hafnium oxide film includes preparing a hafnium target having scandium granules distributed on a peripheral surface thereof; and proceeding a sputtering process to form a scandium-doped hafnium oxide film on a substrate, wherein the scandium doping of the scandium-doped hafnium oxide film is in the range of 3-13%. Such scandium-doped hafnium oxide film is able to be used as an oxide layer in semiconductor element which effectively suppresses the current leakage and reduces the dimension of the semiconductor element. |
申请公布号 |
US2015041731(A1) |
申请公布日期 |
2015.02.12 |
申请号 |
US201313963181 |
申请日期 |
2013.08.09 |
申请人 |
Chung-Shan Institute of Science and Technology Armaments Bureau, Ministry of National Defense |
发明人 |
Tsai Yi-Lung;Bor Hui-Yun;Wei Chao-Nan;Wu Yuan-Pang;Wang Sea-Fue;Chen Hong-Syuan |
分类号 |
H01L21/02;H01L29/06 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method for preparing scandium-doped hafnium oxide film, comprising:
preparing a hafnium target having scandium granules distributed on a peripheral surface thereof, wherein an area of the scandium granules to a peripheral surface of the hafnium target occupation ratio is 6.90-30.57%; and proceeding a sputtering process with the hafnium target to form a scandium-doped hafnium oxide film, wherein argon and oxygen are added with a flow rate of 1:1, and pressure in the sputtering process is selectively adjusted to 1×10−2 and 5×10−7 torr. |
地址 |
Taoyuan County TW |