发明名称 半導体基板、電子デバイスおよび半導体基板の製造方法
摘要 <p><P>PROBLEM TO BE SOLVED: To form a good-quality GaN-based semiconductor crystal layer by using a silicon substrate. <P>SOLUTION: A semiconductor substrate 100 includes a substrate 102 having a first area 104 and a second area 106 on a surface, and a first semiconductor formed over the first area. The surface of the substrate is composed of Si<SB>x</SB>Ge<SB>1-x</SB>(0≤x≤1) and the first area is surrounded by the second area. The first semiconductor is a group III-V compound semiconductor containing a nitrogen atom, is a single crystal, and provides lattice matching or pseudo-lattice matching with the Si<SB>x</SB>Ge<SB>1-x</SB>. The second area has a shape different from that of the first area. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP5667360(B2) 申请公布日期 2015.02.12
申请号 JP20090289408 申请日期 2009.12.21
申请人 发明人
分类号 H01L21/20;H01L21/205 主分类号 H01L21/20
代理机构 代理人
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