发明名称 三次元座標測定機簡易検査用ゲージ
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a simple inspection gauge for three-dimensional coordinate measuring machines capable of simultaneously performing a simple inspection of a dimension inspection (a scale calibration) of a three-dimensional coordinate measuring machine relating to JIS B 7440-2, and a simple inspection of multi-styli relating to JIS B 7440-5 and an evaluation of respective styli or correlation of directivity. <P>SOLUTION: A simple inspection gauge 1 for three-dimensional coordinate measuring machines includes: a base 3; a hemispherical body 4 provided on the base 3; and a plurality of shafts 5 each one end of which is mounted with a spherical body 7 via a retainer 6 and each other end of which is fixed to the body 4. One shaft 5-9 of the plurality of shafts 5 (5-1 to 5-9) is mounted so as to extend from a pole of the body in the vertical direction, and the residual shafts 5-1 to 5-8 are mounted thereon so as to form a predetermined angle with an adjacent shaft in a plan view and to extend obliquely upward. <P>COPYRIGHT: (C)2012,JPO&INPIT</p>
申请公布号 JP5667431(B2) 申请公布日期 2015.02.12
申请号 JP20100287832 申请日期 2010.12.24
申请人 发明人
分类号 G01B5/00;G01B5/008 主分类号 G01B5/00
代理机构 代理人
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