发明名称 PLASMA PROCESSING APPARATUS
摘要 A plasma processing apparatus includes a plasma forming part, a putting stage on which a wafer is put, a bias power supply which supplies high-frequency power to the putting stage and a detection part which detects amounts of positive and negative currents flowing between the bias power supply and the putting stage and a ratio of the positive and negative current amounts, and the plasma processing apparatus adjusts formation of the plasma or the plasma processing condition of the wafer in accordance with the ratio.
申请公布号 US2015041060(A1) 申请公布日期 2015.02.12
申请号 US201414182497 申请日期 2014.02.18
申请人 Hitachi High-Technologies Corporation 发明人 Hirota Kousa;Usui Tatehito;Inoue Satomi;Nakamoto Shigeru
分类号 H01L21/67 主分类号 H01L21/67
代理机构 代理人
主权项 1. A plasma processing apparatus, comprising: a processing container having a processing chamber disposed therein and from which processing gas is exhausted; a unit to supply an electric field in the processing chamber to form plasma using processing gas supplied in the processing chamber; a putting stage disposed in the processing chamber to put a wafer thereon; a bias power supply to supply high-frequency power to an electrode disposed in the putting stage; and a detection part to detect amounts of positive and negative currents flowing between the bias power supply and the putting stage and detect a ratio of a negative current amount (I−) and a positive current amount (I+) from which part caused by electrons in the plasma is removed, wherein formation of the plasma or processing condition using the plasma of a layer to be processed and disposed on the wafer is adjusted in accordance with the ratio.
地址 Tokyo JP