| 摘要 |
<p>A method of measuring high-speed similarity using a histogram and a similarity measuring device capable of performing the same are provided. The method of measuring high-speed similarity according to an embodiment of the present invention comprises: a histogram generation step for generating a histogram of an image of which similarity is to be measured; a metadata generation step for generating a binary number string of the image of which the similarity is to be measured on the basis of the histogram; a matching step for matching, with the binary number string of the image of which the similarity is to be measured, a binary number string of a reference image obtained from a metadata DB; and an output step for outputting a result of the matching.</p> |
