发明名称 |
METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT |
摘要 |
A method of forming an integrated circuit comprises forming a first doped region in a substrate using a first angle ion implantation performed on a first side of a gate structure. The gate structure has a length in a first direction and a width in a second direction. The method also comprises forming a second doped region in the substrate using a second angle ion implantation performed on a second side of the gate structure. The first angle ion implantation has a first implantation angle with respect to the second direction and the second angle ion implantation has a second implantation angle with respect to the second direction. Each of the first implantation angle and the second implantation angle is substantially larger than 0° and less than 90°. |
申请公布号 |
US2015044847(A1) |
申请公布日期 |
2015.02.12 |
申请号 |
US201414490177 |
申请日期 |
2014.09.18 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
WU Zhiqiang;SHEU Yi-Ming;YU Tsung-Hsing;CHENG Kuan-Lun;TSAO Chih-Pin;CHEN Wen-Yuan;CHENG Chun-Fu;WANG Chih-Ching |
分类号 |
H01L21/265;H01L29/66;H01L21/8234 |
主分类号 |
H01L21/265 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of forming an integrated circuit, the method comprising:
forming a first doped region in a substrate using a first angle ion implantation performed on a first side of a gate structure, the gate structure having a length in a first direction and a width in a second direction; and forming a second doped region in the substrate using a second angle ion implantation performed on a second side of the gate structure, wherein the first angle ion implantation has a first implantation angle with respect to the second direction and the second angle ion implantation has a second implantation angle with respect to the second direction, and each of the first implantation angle and the second implantation angle is substantially larger than 0° and less than 90°. |
地址 |
Hsinchu TW |