发明名称 METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT
摘要 A method of forming an integrated circuit comprises forming a first doped region in a substrate using a first angle ion implantation performed on a first side of a gate structure. The gate structure has a length in a first direction and a width in a second direction. The method also comprises forming a second doped region in the substrate using a second angle ion implantation performed on a second side of the gate structure. The first angle ion implantation has a first implantation angle with respect to the second direction and the second angle ion implantation has a second implantation angle with respect to the second direction. Each of the first implantation angle and the second implantation angle is substantially larger than 0° and less than 90°.
申请公布号 US2015044847(A1) 申请公布日期 2015.02.12
申请号 US201414490177 申请日期 2014.09.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 WU Zhiqiang;SHEU Yi-Ming;YU Tsung-Hsing;CHENG Kuan-Lun;TSAO Chih-Pin;CHEN Wen-Yuan;CHENG Chun-Fu;WANG Chih-Ching
分类号 H01L21/265;H01L29/66;H01L21/8234 主分类号 H01L21/265
代理机构 代理人
主权项 1. A method of forming an integrated circuit, the method comprising: forming a first doped region in a substrate using a first angle ion implantation performed on a first side of a gate structure, the gate structure having a length in a first direction and a width in a second direction; and forming a second doped region in the substrate using a second angle ion implantation performed on a second side of the gate structure, wherein the first angle ion implantation has a first implantation angle with respect to the second direction and the second angle ion implantation has a second implantation angle with respect to the second direction, and each of the first implantation angle and the second implantation angle is substantially larger than 0° and less than 90°.
地址 Hsinchu TW