发明名称 Patterning Device Support
摘要 In a lithographic apparatus, slippage of a patterning device is substantially eliminated during movement of a patterning device stage by providing a magnetostrictive actuator to apply an accelerating force to the patterning device to compensate for forces that would otherwise tend to cause slippage when the patterning device stage moves.
申请公布号 US2015042976(A1) 申请公布日期 2015.02.12
申请号 US201414526023 申请日期 2014.10.28
申请人 ASML Holding N.V. 发明人 AMIN-SHAHIDI Darya
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项 1. A patterning device stage system for a lithographic apparatus, comprising: a stage configured to releasably couple a patterning device to the stage; a stage control system configured to control movement of the stage; and a magnetostrictive control system configured to apply a force to the patterning device.
地址 Veldhoven NL US