发明名称 |
Patterning Device Support |
摘要 |
In a lithographic apparatus, slippage of a patterning device is substantially eliminated during movement of a patterning device stage by providing a magnetostrictive actuator to apply an accelerating force to the patterning device to compensate for forces that would otherwise tend to cause slippage when the patterning device stage moves. |
申请公布号 |
US2015042976(A1) |
申请公布日期 |
2015.02.12 |
申请号 |
US201414526023 |
申请日期 |
2014.10.28 |
申请人 |
ASML Holding N.V. |
发明人 |
AMIN-SHAHIDI Darya |
分类号 |
G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
|
代理人 |
|
主权项 |
1. A patterning device stage system for a lithographic apparatus, comprising:
a stage configured to releasably couple a patterning device to the stage; a stage control system configured to control movement of the stage; and a magnetostrictive control system configured to apply a force to the patterning device. |
地址 |
Veldhoven NL US |