发明名称 半導体装置
摘要 <p>In order to increase an aperture ratio, a part of or all of a gate electrode that overlaps with channel formation regions (213, 214) of a pixel TFT is caused to overlap with second wirings (source line or drain line) (154, 157). Additionally, a first interlayer insulating film (149) and a second interlayer insulating film (150c) are disposed between the gate electrode and the second wirings (154, 157) so as to decrease a parasitic capacitance.</p>
申请公布号 JP5668126(B2) 申请公布日期 2015.02.12
申请号 JP20130246277 申请日期 2013.11.28
申请人 发明人
分类号 G02F1/1368;G02F1/1362;H01L21/28;H01L21/336;H01L21/768;H01L21/77;H01L23/532;H01L27/12;H01L27/32;H01L29/786;H01L51/50;H05B33/14 主分类号 G02F1/1368
代理机构 代理人
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