AUTOMATED TEST EQUIPMENT, INSTRUCTION PROVIDER FOR PROVIDING A SEQUENCE OF INSTRUCTIONS, METHOD FOR PROVIDING A SIGNAL TO A DEVICE UNDER TEST, METHOD FOR PROVIDING A SEQUENCE OF INSTRUCTIONS AND TEST SYSTEM

摘要

An automated test equipment comprises a test processor configured to provide a signal to a device under test on the basis of a sequence of instructions defining an evaluation of test vectors. The test processor is configured to map a test vector onto a set of signal states or signal transitions. Furthermore, the test processor is configured to variably select a number of signal states or signal transitions provided in the signal based on a current test vector in dependence on a current instruction.