发明名称 半導体装置の製造方法
摘要 <p>To provide a semiconductor device that can be manufactured using a simple process without ensuring a high embedding property; and a manufacturing method of the device. In the manufacturing method of the semiconductor device according to the invention, a semiconductor substrate having a configuration obtained by stacking a support substrate, a buried insulating film, and a semiconductor layer in order of mention is prepared first. Then, an element having a conductive portion is completed over the main surface of the semiconductor layer. A trench encompassing the element in a planar view and reaching the buried insulating film from the main surface of the semiconductor layer is formed. A first insulating film (interlayer insulating film) is formed over the element and in the trench to cover the element and form an air gap in the trench, respectively. Then, a contact hole reaching the conductive portion of the element is formed in the first insulating film.</p>
申请公布号 JP5669251(B2) 申请公布日期 2015.02.12
申请号 JP20100010085 申请日期 2010.01.20
申请人 发明人
分类号 H01L21/764;H01L21/336;H01L21/76;H01L21/762;H01L27/08;H01L29/786 主分类号 H01L21/764
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