发明名称 |
ANALYSIS DEVICE PROVIDED WITH DISCHARGE IONIZATION CURRENT DETECTOR |
摘要 |
An analysis device comprising a discharge ionization current detector, a plasma gas supply section, a sample gas supply section, a flow rate setting condition holding section and a gas flow rate setting means controller. The flow rate setting condition holding section holds, as a flow rate setting condition, a relationship between a sample gas supply flow rate from the sample gas supply section and a supply flow rate of plasma gas to be set with respect to the sample gas supply flow rate and the gas flow rate controller is configured to set a plasma gas supply flow rate from the plasma gas supply section to a flow rate according to the sample gas supply flow rate, based on the flow rate setting condition held in the flow rate setting condition holding section. |
申请公布号 |
US2015042354(A1) |
申请公布日期 |
2015.02.12 |
申请号 |
US201314384049 |
申请日期 |
2013.02.20 |
申请人 |
SHIMADZU CORPORATION |
发明人 |
Shinada Kei;Horiike Shigeyoshi;Nishimoto Takahiro |
分类号 |
G01N30/64;G01N27/70 |
主分类号 |
G01N30/64 |
代理机构 |
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代理人 |
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主权项 |
1. An analysis device comprising:
a discharge ionization current detector including a plasma generation section that generates dielectric-barrier discharge by applying high AC voltage between a plurality of electrodes attached on an outer circumference of a dielectric tube, a sample ionization section that is arranged on a side of one end of the dielectric tube and that ionizes a sample by excitation light emitted at a time of discharge in the plasma generation section, and a sample ion detection section that detects a sample ionized by the sample ionization section as a current; a plasma gas supply section for supplying plasma gas from a side of the other end of the dielectric tube while variably adjusting a flow rate of the plasma gas; a sample gas supply section for supplying sample gas to the sample ionization section from a side opposite the dielectric tube; a flow rate setting condition holding section for holding, as a flow rate setting condition, a relationship between a sample gas supply flow rate from the sample gas supply section and a supply flow rate of plasma gas to be set with respect to the sample gas supply flow rate; and a gas flow rate controller configured to set a plasma gas supply flow rate from the plasma gas supply section to a flow rate according to the sample gas supply flow rate, based on the flow rate setting condition held in the flow rate setting condition holding section. |
地址 |
Kyoto-shi, Kyoto JP |