发明名称 CIRCUITS, METHODS, AND COMPUTER PROGRAMS TO DETECT MECHANICAL STRESS AND TO MONITOR A SYSTEM
摘要 Embodiments provide a circuit, a method, and a computer program configured to detect mechanical stress and a circuit, a method, and a computer program configured to monitor safety of a system. The detection circuit is configured to detect mechanical stress of a semiconductor circuit. The detection circuit comprises a stress monitor module configured to monitor mechanical stress of the semiconductor circuit and to provide monitor information related to a mechanical stress level of the semiconductor circuit. The detection circuit further comprises an activation signal generator configured to generate an activation signal comprising activation information related to the mechanical stress level of the semiconductor circuit if the monitor information indicates that a mechanical stress level criterion is fulfilled by the semiconductor circuit.
申请公布号 US2015040677(A1) 申请公布日期 2015.02.12
申请号 US201313963341 申请日期 2013.08.09
申请人 Infineon Technologies AG 发明人 Hammerschmidt Dirk
分类号 G01L1/18 主分类号 G01L1/18
代理机构 代理人
主权项 1. A detection circuit configured to detect mechanical stress of a semiconductor circuit, the detection circuit comprising: a stress monitor module configured to monitor mechanical stress of the semiconductor circuit and to provide monitor information related to a mechanical stress level of the semiconductor circuit; and an activation signal generator configured to generate an activation signal comprising activation information related to the mechanical stress level of the semiconductor circuit if the monitor information indicates that a mechanical stress level criterion is fulfilled by the semiconductor circuit.
地址 Neubiberg DE