发明名称 METHOD OF FABRICATING INTEGRATED SEMICONDUCTOR DEVICE AND STRUCTURE THEREOF
摘要 A method of fabricating an integrated semiconductor device, comprising: providing a substrate having a first region and a second region; and forming a semiconductor unit on the first region and forming a micro electro mechanical system (MEMS) unit on the second region in one process.
申请公布号 US2015044808(A1) 申请公布日期 2015.02.12
申请号 US201414495940 申请日期 2014.09.25
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 Huang Hsueh-I;Lee Ming-Tung;Tu Shuo-Lun
分类号 B81C1/00 主分类号 B81C1/00
代理机构 代理人
主权项 1. A method of fabricating an integrated semiconductor device, comprising: providing a substrate having a first region and a second region; forming a plurality of barrier layer between the first and the second region; forming a semiconductor unit on the first region and forming a micro electro mechanical system (MEMS) unit on the second region; and connecting the semiconductor unit on the first region and a micro electro mechanical system (MEMS) unit on the second region with the plurality barrier layers.
地址 Hsinchu TW